- Titre
- Design for Advanced Test and Safety for Image and Photonic Sensors
- Créateurs - sans rôle
- Julia Lefèvre - Test and dEpendability of microelectronic integrated SysTemsPhilippe Debaud - STMicroelectronics [Grenoble]Arnaud Virazel - Test and dEpendability of microelectronic integrated SysTemsPatrick Girard - Test and dEpendability of microelectronic integrated SysTems
- Colloque
- TTTC’s E. J. McCluskey Best Doctoral Thesis Award Contest at ETS’24 Semifinal (The Hague, Netherlands, 20/05/2024–24/05/2024)
- Identifiants
- 9942068409311
- Unité académique
- Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier - LIRMM
- Langue
- English
- Type de ressource
- Conference proceeding
- Champs locaux
- lirmm-04739546
Acte de colloque
Design for Advanced Test and Safety for Image and Photonic Sensors
TTTC’s E. J. McCluskey Best Doctoral Thesis Award Contest at ETS’24 Semifinal (The Hague, Netherlands, 20/05/2024–24/05/2024)
Indicateurs
1 Consultations de la notice