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Correlated carrier number-mobility fluctuation model or access resistance noise in p-MOSFETs
Acte de colloque

Correlated carrier number-mobility fluctuation model or access resistance noise in p-MOSFETs

Alain Hoffmann, M. Valenza, D. Rigaud, A. Laigle et Frédéric Martinez
International Conference on Noise in Physical Systems and 1/f Fluctuations (Prague, Czech Republic, 2003)

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