Résumé
In a standard industrial approach the timing performance verification is obtained using a tabular method that necessitates a great amount of simulations. They must specify, for each drive in each logic family: the load, the input slope, the temperature and the supply voltage sensitivity, for each edge, of the transition time and propagation delay. Extending a logical effort like based model of timing performance of CMOS structures we show in this paper that it is possible to define a specific performance representation allowing a continuous representation of the performance sensitivity of a complete family. We describe the parameter calibration procedure and validate the proposed representation on a 0.13μm process by comparing the performance sensitivity deduced from this representation to sensitivity values obtained from electrical simulations performed with the full process model of the foundry