Résumé
This paper presents a logic diagnosis approach targeting bridging faults. The proposed approach is performed in two phases, (i) a fault localization phase based on the Single-Location-at-A-Time (SLAT) paradigm determining a set of suspects, and (ii) a fault model allocation phase associating a set of fault models to each suspect identified during the first phase. The main advantages of this approach are that the fault localization phase is fault model independent, and that the fault model allocation phase is able to deal at the same time with several bridging fault models leading to either static or dynamic faulty behaviors. Experimental results on full scan circuits show the diagnosis accuracy of the proposed approach in terms of absolute number of suspects. Moreover, a comparison with an industrial reference tool highlights the reliability of our approach.