Compendium of Radiation-Induced Effects for Candidate Particle Accelerator Electronics

S. Danzeca; P. Peronnard; G. Foucard; G. Tsiligiannis; R. Secondo; R. Ferraro; C.G. Mcallister; T. Borel; M. Brugger; A. Masi; S. Gilardoni

doi:10.1109/NSREC.2017.8115434

Acte de colloque

Compendium of Radiation-Induced Effects for Candidate Particle Accelerator Electronics

S. Danzeca, P. Peronnard, G. Foucard, G. Tsiligiannis, R. Secondo, R. Ferraro, C.G. Mcallister, T. Borel, M. Brugger, A. Masi, …

2017 IEEE Radiation Effects Data Workshop, pp.1-6

2017 IEEE Radiation Effects Data Workshop (New Orleans, United States, 17/07/2017–21/07/2017)

2017

DOI: https://doi.org/10.1109/NSREC.2017.8115434

Résumé

Temperature sensors

Particle beams

MOSFET

Registers

Protons

particle accelerators

radiation hardening (electronics)

radiation-induced effects

candidate particle accelerator electronics

particle accelerators electronics

single event effects

total ionizing dose

displacement damage

analog devices

linear devices

digital devices

hybrid devices

Vulnerability of a variety of components for particle accelerators electronics to single event effects, total ionizing dose and displacement damage has been analyzed. The tested parts include analog, linear, digital, and hybrid devices.

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Détails

Titre: Compendium of Radiation-Induced Effects for Candidate Particle Accelerator Electronics
Créateurs - sans rôle: S. Danzeca - European Organization for Nuclear Research
P. Peronnard - European Organization for Nuclear Research
G. Foucard - European Organization for Nuclear Research
G. Tsiligiannis
R. Secondo - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
R. Ferraro - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
C.G. Mcallister
T. Borel - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
M. Brugger - European Organization for Nuclear Research
A. Masi - European Organization for Nuclear Research
S. Gilardoni
Détails de publication: 2017 IEEE Radiation Effects Data Workshop, pp.1-6
Colloque: 2017 IEEE Radiation Effects Data Workshop (New Orleans, United States, 17/07/2017–21/07/2017)
Identifiants: 9942699709311
Unité académique: Institut d'Electronique et des Systèmes - IES
Langue: English
Type de ressource: Conference proceeding
Champs locaux: hal-01768145