Résumé
A 65 nm SRAM has been subjected to muon and low-energy proton beams in static and dynamic modes. The experimental results are compared to test simulations.
- Titre
- Comparison of the Effects of Muon and Low-Energy Proton Irradiation on a 65 nm Low-Power SRAM
- Créateurs - sans rôle
- Alexandre Louis BosserViyas Gupta - Test and dEpendability of microelectronic integrated SysTemsArto Javanainen - Test and dEpendability of microelectronic integrated SysTemsGeorgios Tsiligiannis - Test and dEpendability of microelectronic integrated SysTemsHelmut PuchnerFrédéric Saigné - Université de Montpellier, Institut d'Electronique et des Systèmes - IESFrédéric Wrobel - Université de Montpellier, Institut d'Electronique et des Systèmes - IESAri VirtanenLuigi Dilillo - Test and dEpendability of microelectronic integrated SysTems
- Détails de publication
- 16th European Conference on Radiation and Its Effects on Components and Systems
- Colloque
- RADECS: Radiation and Its Effects on Components and Systems (Bremen, Germany, 19/09/2016–23/09/2016)
- Identifiants
- 9943993409311
- Unité académique
- Institut d'Electronique et des Systèmes - IES; Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier - LIRMM
- Langue
- English
- Type de ressource
- Conference proceeding
- Champs locaux
- lirmm-01337405