Résumé
Radiation-induced faults pose significant challenges for safety-critical systems operating in harsh environments such as space and avionics. Among these effects, Single-Event Upsets (SEUs) can impact both the logic and configuration memories of SRAM-based FPGAs, potentially compromising system functionality and reliability. The Hardened RISC-V System-on-Chip (HARV-SoC) incorporates a fault-tolerant soft-core processor designed with in-circuit hardening techniques such as Triple Modular Redundancy (TMR) and Hamming Error-Correcting Code (ECC), combined with structured fault-observability mechanisms to enhance system resilience under radiation. This work presents a characterization of proton irradiation for the HARV-SoC implemented on an Xilinx Artix-7 FPGA, aiming to investigate the susceptibility of both the processor architecture and the FPGA configuration memory to radiation-induced faults. The experiments were conducted using proton beams at different energies to assess the impact of radiation on functional correctness and recovery behavior, providing insights into the reliability of SRAM-based FPGA platforms for space-grade and mission-critical applications.