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Characterisation of Fragmented Ultra-high Energy Heavy Ion Beam and its Effects on Electronics Single Event Effect Testing
Acte de colloque

Characterisation of Fragmented Ultra-high Energy Heavy Ion Beam and its Effects on Electronics Single Event Effect Testing

Mario Sacristan Barbero, Ivan Slipukhin, D. Prelipcean, Y. Aguiar, N. Emriskova, A. Waets, Andrea Coronetti, M. Kastriotou, Carlo Cazzaniga, T. Dodd, …
Proceedings of RADECS 2023
European Conference on Radiation and its Effects on Components and Systems (RADECS) (Toulouse, France, 25/09/2023–29/09/2023)

Résumé

Ultra-high energy heavy ion beam fragmentation has important implications concerning electronics testing. Primary ion beam and its fragments are characterised by means of electronic detectors, deepening in the consequences for SEE testing in commercial components.

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