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Cache- and register-aware system reliability evaluation based on data lifetime analysis
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Cache- and register-aware system reliability evaluation based on data lifetime analysis

Maha Kooli, Firas Kaddachi, Giorgio Di Natale et Alberto Bosio
34th IEEE VLSI Test Symposium
VTS: VLSI Test Symposium (Las Vegas, United States, 25/04/2016–27/04/2016)
25/04/2016

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