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Bottom-up Analysis of the Impact of Single-Event Effects in a CNN Hardware Accelerator using Laser testing
Acte de colloque

Bottom-up Analysis of the Impact of Single-Event Effects in a CNN Hardware Accelerator using Laser testing

S. Achaq, V Pouget, L. Artola, F. Manni, A. Dufour et J. Boch
2024 24th European Conference on Radiation and Its Effects on Components and Systems (RADECS), p.1 - 6
RADECS 2024 (Maspalomas, Spain, 16/09/2024–20/09/2024)
23/12/2025

Résumé

Pulsed laser testing System-on-Chip 7nm FinFET edge-AI Single-event effects Single-event effects edge-AI 7nm FinFET System-on-Chip Pulsed laser testing

We present laser testing results on the AIEngines array of the 7nm Versal device used in the context of the hardware acceleration of a convolutional neural network application. The first stages of errors propagation are analyzed by testing benchmarks accelerating elementary operations in CNN: The convolutions and data transfer.

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