Résumé
Program flow attacks involve disrupting the flow of instruction execution in microcontrollers (MCUs), thereby threatening their operation. While traditional studies focus on program counter or instruction corruptions within pipelines, little attention has been paid to the stages between FLASH memory and the CPU, such as memory accelerators. Body Bias Injection (BBI) is a fault injection technique in which a voltage pulse is applied to the backside of an integrated circuit, i.e. its substrate, causing localized disruptions in the power network. Despite its proven effectiveness in inducing transient faults, to the best of our knowledge, there is no information on its impact on MCU program flow. Within this context, this paper demonstrates that BBI can efficiently disrupt MCU program flow, causing entire instruction lines to be skipped or repeated. It also shows that the most sensitive part of the MCUs against BBI is likely to be the memory accelerator rather than the processor itself.