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Approximate Computing for Test and Test of Approximate Computing
Acte de colloque   Open Access

Approximate Computing for Test and Test of Approximate Computing

Mario Barbareschi, Alberto Bosio, Patrick Girard, Bastien Deveautour, Marcello Traiola et Arnaud Virazel
IEEE Workshop on Top Picks in VLSI Test and Reliability, pp.1-2
IEEE Workshop on Top Picks in VLSI Test and Reliability (San Diego, United States, 07/11/2024–08/10/2024)
2024

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Approximate Computing Testing Reliability Approximate Computing Testing Reliability

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