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Analyzing the Logic Behavior of Digital CMOS Circuits in Presence of Simultaneous Switching Noise
Acte de colloque   Open Access

Analyzing the Logic Behavior of Digital CMOS Circuits in Presence of Simultaneous Switching Noise

Florence Azaïs, Laurent Larguier et Michel Renovell
8th IEEE Latin American Test Workshop
LATW: Latin American Test Workshop (Cuzco, Peru, 03/2007)
2007

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