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Analyzing and Modeling of the Susceptibility to Temporary Malfunction in Automatic Gain Control Loops
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Analyzing and Modeling of the Susceptibility to Temporary Malfunction in Automatic Gain Control Loops

Tom Billaux, Jérémy Raoult et Patrick Hoffmann
EMC Compo 2024 (Turin (Italie), Italy, 07/10/2024–09/10/2024)

Résumé

Automatic Gain Control Loop Susceptibility Modeling Temporary malfunction RadioFrequency Directed Energy Weapon
The paper presents a study of the dynamic responseof an Automatic Gain Control (AGC) loop exposed to a pulsedradiofrequency intentional interference. The influence of thevarious parameters of the pulse on its behavior is investigated,and a comprehensive model replicating the observed effects ispresented. It is demonstrated that the pulse duration optimizingthe susceptibility studied here is directly linked to the settlingtime of the AGC.

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