Analysis of the Single-Event Latch-up Cross Section of a 16nm FinFET System-on-Chip using Backside Single-Photon Absorption Laser Testing and Correlation with Heavy Ion Data

Matthieu Fongral; Vincent Pouget; Frédéric Saigné; Marine Ruffenach; Jérôme Carron; Florence Malou; Julien Mekki

Acte de colloque

Analysis of the Single-Event Latch-up Cross Section of a 16nm FinFET System-on-Chip using Backside Single-Photon Absorption Laser Testing and Correlation with Heavy Ion Data

Matthieu Fongral, Vincent Pouget, Frédéric Saigné, Marine Ruffenach, Jérôme Carron, Florence Malou et Julien Mekki

Proceedings of RADECS 2023

European Conference on Radiation and its Effects on Components and Systems (RADECS) (Toulouse, France, 25/09/2023–29/09/2023)

Résumé

The SEL cross-section of a 16nm finFET programmable SoC is investigated by combining SPA laser testing, emission microscopy and embedded instrumentation. Results indicate the origin of latch-ups and present excellent correlation with heavy ion data.

Fichiers et liens (1)

url

Find in HALAfficher

Indicateurs

1 Consultations de la notice

Détails

Titre: Analysis of the Single-Event Latch-up Cross Section of a 16nm FinFET System-on-Chip using Backside Single-Photon Absorption Laser Testing and Correlation with Heavy Ion Data
Créateurs - sans rôle: Matthieu Fongral - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
Vincent Pouget - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
Frédéric Saigné - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
Marine Ruffenach - Centre National d'Études Spatiales
Jérôme Carron - Centre National d'Études Spatiales
Florence Malou - Centre National d'Études Spatiales
Julien Mekki - Centre National d'Études Spatiales
Détails de publication: Proceedings of RADECS 2023
Colloque: European Conference on Radiation and its Effects on Components and Systems (RADECS) (Toulouse, France, 25/09/2023–29/09/2023)
Identifiants: 99150884809311
Unité académique: Institut d'Electronique et des Systèmes - IES
Langue: English
Type de ressource: Conference proceeding
Champs locaux: hal-04308603