Analysis of Short-Term NBTI Effect on the Single-Event Upset Sensitivity of a 65nm SRAM using Two-Photon Absorption

El Moukthari Issam; Vincent Pouget; Frédéric Darracq; Camille Larue; Dean Lewis; Philippe Perdu; IEEE

doi:10.1109/RADECS.2013.6937408

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Analysis of Short-Term NBTI Effect on the Single-Event Upset Sensitivity of a 65nm SRAM using Two-Photon Absorption

El Moukthari Issam, Vincent Pouget, Frédéric Darracq, Camille Larue, Dean Lewis, Philippe Perdu et IEEE

Proceedings of the 14th European Conference on Radiation and Its Effects on Components and Systems, pp.1-6

Proceedings of the 14th European Conference on Radiation and Its Effects on Components and Systems

14th European Conference on Radiation and Its Effects on Components and Systems

09/2013

DOI: https://doi.org/10.1109/RADECS.2013.6937408

Résumé

Electronics

Engineering Sciences

Optics

Photonic

We used two-photon absorption laser testing to characterize the effect of short-term NBTI aging on the SEU sensitivity of 65 nm CMOS SRAM cell. Results indicate a fast increase of SEU sensitivity due to aging.

Indicateurs

1 Consultations de la notice

Détails

Titre: Analysis of Short-Term NBTI Effect on the Single-Event Upset Sensitivity of a 65nm SRAM using Two-Photon Absorption
Créateurs - sans rôle: El Moukthari Issam - Laboratoire de l'intégration, du matériau au système
Vincent Pouget - Laboratoire de l'intégration, du matériau au système
Frédéric Darracq - Laboratoire de l'intégration, du matériau au système
Camille Larue
Dean Lewis - Laboratoire de l'Intégration du Matériau au Système
Philippe Perdu - Centre National d'Études Spatiales
IEEE
Détails de publication: Proceedings of the 14th European Conference on Radiation and Its Effects on Components and Systems, pp.1-6
Colloque: 14th European Conference on Radiation and Its Effects on Components and Systems
Publications en série: Proceedings of the 14th European Conference on Radiation and Its Effects on Components and Systems
Éditeur: IEEE
Nombre de pages: 6
Identifiants: 99162131209311
Unité académique: Institut d'Electronique et des Systèmes - IES
Langue: English
Type de ressource: Conference proceeding