- Titre
- Analysis of Root Causes of Alpha Sensitivity Variations on Microprocessors Manufactured using Different Cell Layouts
- Créateurs - sans rôle
- Paolo Rech - Université de Montpellier, Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier - LIRMMMichelangelo Grosso - Polytechnic University of TurinFabio Melchiori - STMicroelectronics (Italy)Domenico Loparco - STMicroelectronics (Italy)Davide Appello - STMicroelectronics (Italy)Luigi Dilillo - Université de MontpellierAlessandro Paccagnella - University of PaduaMatteo Sonza Reorda - Politecnico di Torino = Polytechnic of Turin
- Détails de publication
- 16th IEEE International Symposium on On-Line Testing and Robust System Design, pp.29-34
- Colloque
- IOLTS: International On-Line Testing Symposium (Corfu, Greece, 05/07/2010–07/07/2010)
- Identifiants
- 9940092409311
- Unité académique
- Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier - LIRMM
- Langue
- English
- Type de ressource
- Conference proceeding
- Champs locaux
- lirmm-00559034
Acte de colloque
Analysis of Root Causes of Alpha Sensitivity Variations on Microprocessors Manufactured using Different Cell Layouts
16th IEEE International Symposium on On-Line Testing and Robust System Design, pp.29-34
IOLTS: International On-Line Testing Symposium (Corfu, Greece, 05/07/2010–07/07/2010)
05/07/2010
Indicateurs
1 Consultations de la notice