Analysis and Detection of Multiple Cell Upsets in SRAM Memories Used as Particle Detectors

Acte de colloque

R. Secondo, G. Foucard, S. Danzeca, R. Losito, P. Peronnard, A. Masi, M. Brugger et Laurent Dusseau

European Conference on Radiation and Its Effects on Components and Systems (IEEE-RADECS2015 ) (Moscou, Russia, 2015)

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Titre: Analysis and Detection of Multiple Cell Upsets in SRAM Memories Used as Particle Detectors
Créateurs - sans rôle: R. Secondo - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
G. Foucard
S. Danzeca - European Organization for Nuclear Research
R. Losito - European Organization for Nuclear Research
P. Peronnard
A. Masi - European Organization for Nuclear Research
M. Brugger - European Organization for Nuclear Research
Laurent Dusseau - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
Colloque: European Conference on Radiation and Its Effects on Components and Systems (IEEE-RADECS2015 ) (Moscou, Russia, 2015)
Identifiants: 9947148509311
Unité académique: Centre Spatial de l'Université de Montpellier - CSUM; Institut d'Electronique et des Systèmes - IES
Langue: English
Type de ressource: Conference proceeding
Champs locaux: hal-02033356