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An effective hybrid fault-tolerant architecture for pipelined cores
Acte de colloque

An effective hybrid fault-tolerant architecture for pipelined cores

Imran Wali, Arnaud Virazel, Alberto Bosio, Luigi Dilillo et Patrick Girard
20th European Test Symposium
ETS: European Test Symposium (Cluj-Napoca, Romania, 25/05/2015–29/05/2015)
05/2015

Résumé

Fault tolerant systems CMOS logic circuits Transient analysis Registers Fault tolerance Redundancy Microprocessors Combinational circuits Logic design Integrated circuit reliability Microprocessor chips CMOS technology scaling Pipelined cores MIPS microprocessor Circuit faults Pipelines Transient and permanent faults

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