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Affiche : "Pore-sealing study by ellipsometric porosimetry on a porous low k - effect of plasma tretaments and wet cleaning"
Acte de colloque

Affiche : "Pore-sealing study by ellipsometric porosimetry on a porous low k - effect of plasma tretaments and wet cleaning"

W. Puyrenier, L. Broussous, A. Ayral, V. Rouessac et C. Pernel
Materials for Advanced Metallization Conference 2006 (Grenoble, France, 2006)
2006

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