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Absolute Pitch, Roll and Yaw Measurement on CMOS
Acte de colloque

Absolute Pitch, Roll and Yaw Measurement on CMOS

Aboubacar Chaehoi, Norbert Dumas, Frédérick Mailly, Laurent Latorre et Pascal Nouet
4th IEEE Conference on Sensors, Vol.1 & 2, pp.133-136
4th IEEE Conference on Sensors (Irvine, CA (USA), 31/10/2005–03/11/2005)
2005

Résumé

MEMS CMOS Inertial Sensors

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