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A robust and reliable RF-MEMS switch fabricated thanks to an original dielectric free design and an innovative process flow IEEE Sensors 2013, 3-6 Nov. 2013, Baltimore, USA.
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A robust and reliable RF-MEMS switch fabricated thanks to an original dielectric free design and an innovative process flow IEEE Sensors 2013, 3-6 Nov. 2013, Baltimore, USA.

Frédéric Souchon, B. Reig, C. Dieppedale, H. Sibuet, B. Blampey et J.-M. Duchamp
IEEE Sensors 2013, pp.1-4
IEEE Sensors 2013 (Baltimore, United States, 03/11/2013–06/11/2013)
2013

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