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A low-threshold Sb-based edge-emitting semiconductor laser emitting at 2.26 μm
Acte de colloque

A low-threshold Sb-based edge-emitting semiconductor laser emitting at 2.26 μm

A. Pérona, Y. Rouillard, A. Salhi, P. Grech, F. Chevrier, A. Yarekha, A. Garnache, A. N. Baranov et C. Alibert
14th Indium Phosphide and Related Materials Conference (IPRM) (Stockholm, Sweden, 12/05/2002–16/05/2002)
2002

Résumé

We have grown semiconductor lasers by molecular beam epitaxy (MBE) on [100] oriented GaSb:Te substrates. An 80% internal quantum efficiency was deduced from measurements of the external quantum efficiency versus cavity length. Internal losses as low as 7 cm/sup -1/ have been found. The system is able to reach threshold current densities as low as 63 A/cm/sup 2/ per well for a cavity length of 1200 /spl mu/m. This is, to our knowledge, the best reported value at 2.26 /spl mu/m.

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