- Titre
- A Structural Testing Approach for SRAMs using Cell-Aware Methodology
- Créateurs - sans rôle
- Xhesila Xhafa - Test and dEpendability of microelectronic integrated SysTemsEric Faehn - STMicroelectronics [Crolles]Patrick Girard - Test and dEpendability of microelectronic integrated SysTemsArnaud Virazel - Test and dEpendability of microelectronic integrated SysTems
- Colloque
- South European Test Seminar (Claviere, Italy, 11/03/2024–15/03/2024)
- Identifiants
- 9942059409311
- Unité académique
- Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier - LIRMM
- Langue
- English
- Type de ressource
- Conference proceeding
- Champs locaux
- lirmm-04739520
Acte de colloque
A Structural Testing Approach for SRAMs using Cell-Aware Methodology
South European Test Seminar (Claviere, Italy, 11/03/2024–15/03/2024)
Indicateurs
1 Consultations de la notice