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A Sextuple Cross-Coupled SRAM Cell Protected against Double-Node Upsets
Acte de colloque   Open Access

A Sextuple Cross-Coupled SRAM Cell Protected against Double-Node Upsets

Aibin Yan, Yan Chen, Jun Zhou, Tianming Ni, Xiaoqing Wen et Patrick Girard
2020 IEEE 29th Asian Test Symposium (ATS), pp.1-5
ATS 2020 - 28th IEEE Asian Test Symposium (Penang, Malaysia, 23/11/2020–26/11/2020)
28/12/2020

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