- Titre
- A Novel Test Flow for Approximate Digital Circuits
- Créateurs - sans rôle
- Marcello Traiola - Test and dEpendability of microelectronic integrated SysTemsArnaud Virazel - Test and dEpendability of microelectronic integrated SysTemsPatrick Girard - Test and dEpendability of microelectronic integrated SysTemsMario Barbareschi - University of Naples Federico IIAlberto Bosio - Test and dEpendability of microelectronic integrated SysTems
- Colloque
- DATE 2020 - EDAA/IEEE/ACM Design Automation & Test in Europe Conference, PhD Forum (Grenoble, France, 09/03/2020–13/03/2020)
- Identifiants
- 99108092909311
- Unité académique
- Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier - LIRMM
- Langue
- English
- Type de ressource
- Conference proceeding
- Champs locaux
- lirmm-03993654
Acte de colloque
A Novel Test Flow for Approximate Digital Circuits
DATE 2020 - EDAA/IEEE/ACM Design Automation & Test in Europe Conference, PhD Forum (Grenoble, France, 09/03/2020–13/03/2020)
Indicateurs
1 Consultations de la notice