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A New Technique for Low-Cost Phase Noise Production Testing from 1-bit Signal Acquisition
Acte de colloque

A New Technique for Low-Cost Phase Noise Production Testing from 1-bit Signal Acquisition

Stéphane David-Grignot, Florence Azaïs, Laurent Latorre et François Lefevre
20th European Test Symposium, pp.1-6
ETS: European Test Symposium (Cluj-Napoca, Romania, 25/05/2015–29/05/2015)
2015

Résumé

Test cost reduction Phase noise 1-bit acquisition Digital ATE Digital signal processing Analog signals

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1 Consultations de la notice

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