Résumé
This paper proposes a new scan-based side-channel attack on RSA public-key cryptographic implementations in the presence of advanced Design for Testability (DfT) techniques. The attack is performed on an actual hardware implementation, for which different test scenarios were conceived (response compaction, X-Masking). The practical aspects of scan-based attacks on the RSA cryptosystem are also presented. Additionally, a novel scan-attack security analysis tool is proposed which helps in evaluating the scan-chain leakage resi-lience of security circuits