A New Bulk Built-in Current Sensor-Based Strategy for Dealing with Long-Duration Transient Faults in Deep-Submicron Technologies

Rodrigo Possamai Bastos; Giorgio Di Natale; Marie-Lise Flottes; Bruno Rouzeyre

doi:10.1109/DFT.2011.15

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A New Bulk Built-in Current Sensor-Based Strategy for Dealing with Long-Duration Transient Faults in Deep-Submicron Technologies

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A New Bulk Built-in Current Sensor-Based Strategy for Dealing with Long-Duration Transient Faults in Deep-Submicron Technologies

Rodrigo Possamai Bastos, Giorgio Di Natale, Marie-Lise Flottes et Bruno Rouzeyre

DFT'2011: International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, pp.302-308

DFT'2011: International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (Vancouver, Canada, 03/10/2011–05/10/2011)

15/12/2011

DOI: https://doi.org/10.1109/DFT.2011.15

Résumé

concurrent error detection schemes

fault attacks

long-duration transient faults

soft errors

Today's deeply-scaled technology-based integrated circuits are highly sensitive to soft error, tending to be even more in the future. In fact, emerging critical issues are related to transient faults that now can be as long as circuits' clock periods. This work presents a novel improved strategy based on bulk built-in current sensors that is able to cope with long-duration transient faults. Our cost-effective approach is a concurrent error detection scheme with recovery procedure, and rather than existing similar strategy, it has faster correction latency and uses less recovery resources.

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Titre: A New Bulk Built-in Current Sensor-Based Strategy for Dealing with Long-Duration Transient Faults in Deep-Submicron Technologies
Créateurs - sans rôle: Rodrigo Possamai Bastos - Conception et Test de Systèmes MICroélectroniques
Giorgio Di Natale - Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier
Marie-Lise Flottes - Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier
Bruno Rouzeyre - Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier
Contributeurs - sans rôle: IEEE
Détails de publication: DFT'2011: International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, pp.302-308
Colloque: DFT'2011: International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (Vancouver, Canada, 03/10/2011–05/10/2011)
Identifiants: 9946809909311
Unité académique: Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier - LIRMM
Langue: English
Type de ressource: Conference proceeding
Champs locaux: lirmm-00701789