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A Model of DPA Syndrome and Its Application to the Identification of Leaking Gates
Acte de colloque   Open Access

A Model of DPA Syndrome and Its Application to the Identification of Leaking Gates

Alin Razafindraibe et Philippe Maurine
17th International Workshop on Power and Timing Modeling, Optimization and Simulation, Vol.LNCS(4644), pp.394-403
Integrated Circuit and System Design
PATMOS: Power And Timing Modeling, Optimization and Simulation (Gothenburg, Sweden, 03/09/2007–05/09/2007)
03/09/2007

Résumé

Leaking gate

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