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A Model for Resistive Open Recursivity in CMOS Random Logic
Acte de colloque

A Model for Resistive Open Recursivity in CMOS Random Logic

Michel Renovell, Mariane Comte, Nicolas Houarche, Ilia Polian, Piet Engelke et Bernd Becker
EWDTS: East-West Design & Test Symposium, pp.21-24
EWDTS: East-West Design & Test Symposium (Lviv, Ukraine, 09/10/2008–12/10/2008)
10/2008

Résumé

Delay testing Resistive open Defect oriented test
This paper analyzes the electrical behaviour of resistive opens as a function of its unpredictable resistance. It is demonstrated that the electrical behaviour depends on the value of the open resistance. It is also shown that, due to the memory effect detection of the open by a given vector Ti depends on all the vectors that have been applied to the circuit before Ti. An electrical analysis of this memory effect is presented.

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