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A Low-Cost Reliability vs. Cost Trade-Off Methodology to Selectively Harden Logic Circuits
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A Low-Cost Reliability vs. Cost Trade-Off Methodology to Selectively Harden Logic Circuits

Imran Wali, Bastien Deveautour, Arnaud Virazel, Alberto Bosio, Patrick Girard et Matteo Sonza Reorda
21th IEEE European Test Symposium
ETS: European Test Symposium (Amsterdam, Netherlands, 23/05/2016–27/05/2016)
2016

Résumé

High dependability Fault tolerance Fault injection Susceptibility analysis Single event transient Permanent fault Delay fault Power consumption

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