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A History-Based Technique for Faults Diagnosis in SRAMs
Acte de colloque

A History-Based Technique for Faults Diagnosis in SRAMs

Alexandre Ney, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel et Magali Bastian Hage-Hassan
Colloque GDR SoC-SiP (France)
2008

Résumé

In this paper, we present a new diagnosis approach that represents an alternative to signature-based approaches. This new diagnosis technique, named history-based diagnosis, makes use of the effect-cause paradigm already developed for logic design diagnosis. It consists in creating a database containing the history of operations (read and write) performed on a faulty memory core-cell. This database is further used to generate diagnosis results.

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