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A Highly Reliable and Low Power RHBD Flip-Flop Cell for Aerospace Applications
Acte de colloque   Open Access

A Highly Reliable and Low Power RHBD Flip-Flop Cell for Aerospace Applications

Aibin Yan, Kuikui Qian, Jie Cui, Ningning Cui, Zhengfeng Huang, Xiaoqing Wen et Patrick Girard
VTS 2022 - IEEE 40th VLSI Test Symposium, pp.1-6
VTS 2022 - IEEE 40th VLSI Test Symposium (San Diego, CA, United States, 25/04/2022–27/04/2022)
2022

Résumé

radiation hardness circuit reliability flip-flop cell soft error double-node-upset

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