A Fully Integrated 32 nm MultiProbe for Dynamic PVT Measurements within Complex Digital SoC

Lionel Vincent; Edith Beigné; Laurent Alacoque; Suzanne Lesecq; Catherine Bour; Philippe Maurine

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A Fully Integrated 32 nm MultiProbe for Dynamic PVT Measurements within Complex Digital SoC

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A Fully Integrated 32 nm MultiProbe for Dynamic PVT Measurements within Complex Digital SoC

Lionel Vincent, Edith Beigné, Laurent Alacoque, Suzanne Lesecq, Catherine Bour et Philippe Maurine

2nd International Workshop on CMOS Variability

VARI: International Workshop on CMOS Variability (Grenoble, France, 30/05/2011–31/05/2011)

2011

Résumé

AVFS

DVFS

calibration

digital

sensors

low-power

architecture

monitoring

temperature

variability

voltage

drop

power management

multiprobe

ring oscillator

This paper deals with the design of a compact Process, Voltage and Temperature (PVT) probe architecture, in 32nm CMOS technology. The sensor, hereafter named MultiProbe, is composed of 7 different ring oscillators, each one presenting a particular sensitivity to PVT variations. The architecture allows MultiProbes to be chained, so that a single controller is needed. Simulation results exhibit the non-linearity behavior of the ring oscillators under temperature and voltage variations as well as their particular behavior. Due to their small size, the Multiprobe blocks can be easily integrated within a complex digital SoC architecture.

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Titre: A Fully Integrated 32 nm MultiProbe for Dynamic PVT Measurements within Complex Digital SoC
Créateurs - sans rôle: Lionel Vincent - Commissariat à l'Énergie Atomique et aux Énergies Alternatives
Edith Beigné - Commissariat à l'Énergie Atomique et aux Énergies Alternatives
Laurent Alacoque - Commissariat à l'Énergie Atomique et aux Énergies Alternatives
Suzanne Lesecq - Commissariat à l'Énergie Atomique et aux Énergies Alternatives
Catherine Bour - Commissariat à l'Énergie Atomique et aux Énergies Alternatives
Philippe Maurine - Conception et Test de Systèmes MICroélectroniques
Colloque: VARI: International Workshop on CMOS Variability (Grenoble, France, 30/05/2011–31/05/2011)
Publications en série: 2nd International Workshop on CMOS Variability
Identifiants: 9942500309311
Unité académique: Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier - LIRMM
Langue: English
Type de ressource: Conference proceeding
Champs locaux: hal-01067989