Logo image
Sign in
A Detailed Electrical Analysis of SEE on 28 nm FDSOI SRAM Architectures
Conference proceeding

A Detailed Electrical Analysis of SEE on 28 nm FDSOI SRAM Architectures

Cleiton Marques, Leonardo Brendler, Frédéric Wrobel, Alexandra Zimpeck, Walter Bartra, Paulo Butzen and Cristina Meinhardt
2023
url
Find in HALView

Metrics

1 Record Views

Details

Logo image