Logo image
Se connecter
Retour
A Comprehensive Approach to a Trusted Test Infrastructure
Acte de colloque   Open Access

A Comprehensive Approach to a Trusted Test Infrastructure

Marc Merandat, Vincent Reynaud, Emanuele Valea, Jerome Quevremont, Nicolas Valette, Paolo Maistri, Régis Leveugle, Marie-Lise Flottes, Sophie Dupuis, Bruno Rouzeyre, …
IVSW 2019 - 4th IEEE International Verification and Security Workshop, pp.43-48
IVSW 2019 - 4th IEEE International Verification and Security Workshop (Rhodes, Greece, 01/07/2019–03/07/2019)
03/10/2019
DOI: https://doi.org/10.1109/IVSW.2019.8854428

Résumé

Test Scan chains IEEE 1687 BIST Authentication Scan chain encryption
The testability of electronic devices is of critical importance and it is often supported by IEEE standards. The available methods, on the other hand, can be an entry point to a malicious attacker, if no proper countermeasure is adopted. In this paper, we report the latest results from the HADES project, presenting a portfolio of solution towards a secure test infrastructure.

Fichiers et liens (1)

url
Find in HALAfficher

Indicateurs

1 Consultations de la notice

Détails

Logo image