- Title
- Wireless Wafer Test for Iterative Testing During System Assembly
- Creators - without role
- Ziad Noun - Université de Montpellier, Laboratoire d'Informatique de Robotique et de Microélectronique de Mtp - LIRMMPhilippe Cauvet - OphtimaliaMarie-Lise Flottes - Conception et Test de Systèmes MICroélectroniquesDavid Andreu - Artificial movement and gait restorationSerge Bernard - Conception et Test de Systèmes MICroélectroniques
- Conference
- 3D-Test: Testing Three-Dimensional Stacked Integrated Circuits (Austin, Texas, United States, 04/11/2010)
- Identifiers
- 9938236909311
- Academic Unit
- Laboratoire d'Informatique de Robotique et de Microélectronique de Mtp - LIRMM
- Language
- English
- Resource Type
- Conference poster
- Local Fields
- lirmm-00537849
Conference poster
Wireless Wafer Test for Iterative Testing During System Assembly
3D-Test: Testing Three-Dimensional Stacked Integrated Circuits (Austin, Texas, United States, 04/11/2010)
04/11/2010
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