The Use of High Energy X-Ray Generators for TID Testing of Electronic Devices

Vincent Girones; Jérôme Boch; Frédéric Saigné; Rubén García

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The Use of High Energy X-Ray Generators for TID Testing of Electronic Devices

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The Use of High Energy X-Ray Generators for TID Testing of Electronic Devices

Vincent Girones, Jérôme Boch, Frédéric Saigné and Rubén García

RADECS (Venise, Italy, 03/10/2022–07/10/2022)

Abstract

BJT

MOS

X-ray

Cobalt 60

Filter

TID

The use of a high energy X-ray generator for electronic device TID testing is studied and compared to cobalt-60. Xray spectrum is filtered to reduce photoelectric effect due to low energy photons. Experimental results are presented and discussed.

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Title: The Use of High Energy X-Ray Generators for TID Testing of Electronic Devices
Creators - without role: Vincent Girones - Institut d'Électronique et des Systèmes
Jérôme Boch - Institut d'Électronique et des Systèmes
Frédéric Saigné - Institut d'Électronique et des Systèmes
Rubén García - CERN [Genève]
Conference: RADECS (Venise, Italy, 03/10/2022–07/10/2022)
Identifiers: 9943232109311
Academic Unit: Institut d'Electronique et des Systèmes - IES
Language: English
Resource Type: Conference poster
Local Fields: hal-04580360