- Title
- Small Delay Defect Investigation in Critical Path Delay with Multiple TSVs
- Creators - without role
- Carolina Momo Metzler - Universidade Federal do Rio Grande do SulAida Todri-Sanial - Smart Integrated Electronic SystemsPatrick Girard - Test and dEpendability of microelectronic integrated SysTems
- Conference
- EMicro-NE (Campina Grande, Brazil, 30/10/2015–01/11/2015)
- Identifiers
- 9943936509311
- Academic Unit
- Laboratoire d'Informatique de Robotique et de Microélectronique de Mtp - LIRMM
- Language
- English
- Resource Type
- Conference poster
- Local Fields
- lirmm-01456983
Conference poster
Small Delay Defect Investigation in Critical Path Delay with Multiple TSVs
EMicro-NE (Campina Grande, Brazil, 30/10/2015–01/11/2015)
2015
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