Scan chain encryption in Test Standards

Conference poster

Open access

Mathieu da Silva, Giorgio Di Natale, Marie-Lise Flottes and Bruno Rouzeyre

SURREALIST: SecURity, REliAbiLity, test, prIvacy, Safety and Trust of Future Devices (Bremen, Germany, 31/05/2018–01/06/2018)

2018

Files and links (1)

url

Find in HALView

1 Record Views

Title: Scan chain encryption in Test Standards
Creators - without role: Mathieu da Silva - Test and dEpendability of microelectronic integrated SysTems
Giorgio Di Natale - Test and dEpendability of microelectronic integrated SysTems
Marie-Lise Flottes - Test and dEpendability of microelectronic integrated SysTems
Bruno Rouzeyre - Test and dEpendability of microelectronic integrated SysTems
Conference: SURREALIST: SecURity, REliAbiLity, test, prIvacy, Safety and Trust of Future Devices (Bremen, Germany, 31/05/2018–01/06/2018)
Identifiers: 9942498609311
Academic Unit: Laboratoire d'Informatique de Robotique et de Microélectronique de Mtp - LIRMM
Language: English
Resource Type: Conference poster
Local Fields: lirmm-01882578