- Title
- Scan Chain Encryption for the Test, Diagnosis and Debug of Secure Circuits
- Creators - without role
- Mathieu da Silva - Test and dEpendability of microelectronic integrated SysTemsGiorgio Di Natale - Test and dEpendability of microelectronic integrated SysTemsMarie-Lise Flottes - Test and dEpendability of microelectronic integrated SysTemsBruno Rouzeyre - Test and dEpendability of microelectronic integrated SysTems
- Conference
- SETS: South European Test Seminar (Alpe d'Huez, France, 20/03/2017–24/03/2017)
- Identifiers
- 9942438009311
- Academic Unit
- Laboratoire d'Informatique de Robotique et de Microélectronique de Mtp - LIRMM
- Language
- English
- Resource Type
- Conference poster
- Local Fields
- lirmm-01892667
Conference poster
Scan Chain Encryption for the Test, Diagnosis and Debug of Secure Circuits
SETS: South European Test Seminar (Alpe d'Huez, France, 20/03/2017–24/03/2017)
2017
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