- Title
- Parallel Test of Identical Cores Using Test Elevators in 3D Circuits
- Creators - without role
- Alberto Bosio - Conception et Test de Systèmes MICroélectroniquesGiorgio Di Natale - Conception et Test de Systèmes MICroélectroniques
- Conference
- 3D-Test: Testing Three-Dimensional Stacked Integrated Circuits (Austin, TX, United States, 04/11/2010–05/11/2010)
- Identifiers
- 9946372209311
- Academic Unit
- Laboratoire d'Informatique de Robotique et de Microélectronique de Mtp - LIRMM
- Language
- English
- Resource Type
- Conference poster
- Local Fields
- lirmm-00537857
Conference poster
Parallel Test of Identical Cores Using Test Elevators in 3D Circuits
3D-Test: Testing Three-Dimensional Stacked Integrated Circuits (Austin, TX, United States, 04/11/2010–05/11/2010)
04/11/2010
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