NAND Flash Testing: A Preliminary Study on Actual Defects

Pierre-Didier Mauroux; Arnaud Virazel; Alberto Bosio; Luigi Dilillo; Patrick Girard; Serge Pravossoudovitch; Benoît Godard

doi:10.1109/TEST.2009.5355898

Conference poster

NAND Flash Testing: A Preliminary Study on Actual Defects

Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch and Benoît Godard

ITC: International Test Conference (Austin, TX, United States, 01/11/2009–06/11/2009)

2009

DOI: https://doi.org/10.1109/TEST.2009.5355898

Abstract

Embedded flash memories are dominated by the NOR architecture but NAND is becoming more and more adopted due to its high storage capacity. This paper presents a preliminary study on actual defects in NAND array.

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Title: NAND Flash Testing: A Preliminary Study on Actual Defects
Creators - without role: Pierre-Didier Mauroux - Université de Montpellier, Laboratoire d'Informatique de Robotique et de Microélectronique de Mtp - LIRMM
Arnaud Virazel - Université de Montpellier
Alberto Bosio - Université de Montpellier
Luigi Dilillo - Université de Montpellier
Patrick Girard - Université de Montpellier
Serge Pravossoudovitch - Université de Montpellier
Benoît Godard - Atmel
Conference: ITC: International Test Conference (Austin, TX, United States, 01/11/2009–06/11/2009)
Identifiers: 9943781409311
Academic Unit: Laboratoire d'Informatique de Robotique et de Microélectronique de Mtp - LIRMM
Language: English
Resource Type: Conference poster
Local Fields: lirmm-00433765