- Title
- Influence of Parasitic Memory Effect on Single-Cell Faults in SRAMs
- Creators - without role
- Sandra Irobi - Delft University of TechnologyZaid Al-Ars - Delft University of TechnologySaid Hamdioui - Delft University of TechnologyMichel Renovell - Conception et Test de Systèmes MICroélectroniques
- Publication Details
- DDECS'11: 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits ans Systems, pp.159-162
- Conference
- DDECS'11: 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits ans Systems (Germany)
- Identifiers
- 9943291009311
- Academic Unit
- Laboratoire d'Informatique de Robotique et de Microélectronique de Mtp - LIRMM
- Language
- English
- Resource Type
- Conference poster
- Local Fields
- lirmm-00591995
Conference poster
Influence of Parasitic Memory Effect on Single-Cell Faults in SRAMs
DDECS'11: 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits ans Systems, pp.159-162
DDECS'11: 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits ans Systems (Germany)
13/04/2011
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