Failure Mechanisms due to Process Variations in Nanoscale SRAM Core-Cells

Conference poster

Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel and Magali Bastian Hage-Hassan

ETS: European Test Symposium (Southampton, United Kingdom, 21/05/2006–25/05/2006)

05/2006

Abstract

Mismatch Defects

Test

DRAM Memory

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Title: Failure Mechanisms due to Process Variations in Nanoscale SRAM Core-Cells
Creators - without role: Patrick Girard - Conception et Test de Systèmes MICroélectroniques
Serge Pravossoudovitch - Conception et Test de Systèmes MICroélectroniques
Arnaud Virazel - Conception et Test de Systèmes MICroélectroniques
Magali Bastian Hage-Hassan - Infineon Technologies France
Conference: ETS: European Test Symposium (Southampton, United Kingdom, 21/05/2006–25/05/2006)
Identifiers: 9942055109311
Academic Unit: Laboratoire d'Informatique de Robotique et de Microélectronique de Mtp - LIRMM
Language: English
Resource Type: Conference poster
Local Fields: lirmm-00134787