Abstract
We examine the capture dynamics of excitons by basal stacking faults in a-plane GaN by using time-resolved CL.
- Title
- Exciton localization on basal stacking faults in a-plane GaN probed by picosecond time-resolved cathodoluminescence.
- Creators - without role
- Pierre Corfdir - Institute of Condensed Matter Physics [Lausanne]Pierre Lefebvre - Université de Montpellier, Laboratoire Charles Coulomb - L2CJ. Ristic - Institut de Photonique et d'Electronique QuantiquesAmélie Dussaigne - Institute of Condensed Matter Physics [Lausanne]Samuel Sonderegger - Institute of Condensed Matter Physics [Lausanne]Denis Martin - Institute of Condensed Matter Physics [Lausanne]Jean-Daniel Ganière - Institute of Condensed Matter Physics [Lausanne]N. Grandjean - Institute of Condensed Matter Physics [Lausanne]Benoit Deveaud-Plédran - Institute of Condensed Matter Physics [Lausanne]
- Conference
- Int. Conf. On Optics of Excitons in Confined Systems - OECS11. (Madrid, Spain, 07/09/2009–11/09/2009)
- Identifiers
- 9944336209311
- Academic Unit
- Laboratoire Charles Coulomb - L2C
- Language
- English
- Resource Type
- Conference poster
- Local Fields
- hal-00797193