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Analog Measurements based on Digital Test Equipment for Low-Cost Testing of Analog/RF Circuits
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Analog Measurements based on Digital Test Equipment for Low-Cost Testing of Analog/RF Circuits

Stéphane David-Grignot, Florence Azaïs, Laurent Latorre and François Lefevre
ETS: European Test Symposium (Avignon, France, 27/05/2013–31/05/2013)
2013
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