- Titre
- A Lockstep-based Solution for a Radiation-Resilient RISC-V FPGA-Based Architecture
- Créateurs - sans rôle
- Hugo Closquinet - Test and dEpendability of microelectronic integrated SysTemsFlorent Miller - NUCLETUDES [Les Ulis]Luc Noizette - NUCLETUDES [Les Ulis]Youri Helen - DGA Maîtrise de l'informationPatrick Girard - Test and dEpendability of microelectronic integrated SysTemsArnaud Virazel - Test and dEpendability of microelectronic integrated SysTemsThibault Vayssade - NXP (Germany)
- Colloque
- BITFLIP 2025 - Cyber, Reliability and Tolerance of Faults in Electronic Components (Rennes, France, 19/11/2025–20/11/2025)
- Identifiants
- 99208118209311
- Unité académique
- Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier - LIRMM
- Langue
- Anglais
- Type de ressource
- Poster de colloque
- Champs locaux
- lirmm-05568652
Poster de colloque
A Lockstep-based Solution for a Radiation-Resilient RISC-V FPGA-Based Architecture
BITFLIP 2025 - Cyber, Reliability and Tolerance of Faults in Electronic Components (Rennes, France, 19/11/2025–20/11/2025)
Indicateurs
1 Consultations de la notice