- Title
- Space Radiation Effects in Electronics
- Creators - without role
- Luigi Dilillo - Test and dEpendability of microelectronic integrated SysTemsAlexandre Louis Bosser - Test and dEpendability of microelectronic integrated SysTemsArto JavanainenAri Virtanen
- Publication Details
- Rad-hard Semiconductor Memories, (Series in Electronic Materials and Devices), pp.1-56
- Identifiers
- 9945941909311
- Academic Unit
- Laboratoire d'Informatique de Robotique et de Microélectronique de Mtp - LIRMM
- Language
- English
- Resource Type
- Book chapter
- Local Fields
- lirmm-02007913
Book chapter
Space Radiation Effects in Electronics
Rad-hard Semiconductor Memories, (Series in Electronic Materials and Devices), pp.1-56
11/2018
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